High-resolution transmission electron microscopy studies of structural modifications in Pd-Al₂O₃ interfacesMUSCHIK, T; RÜHLE, M.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1992, Vol 65, Num 2, pp 363-388, issn 0141-8610Article

Electroluminescence in a-Si1-xCx: H p-i-n structuresPEVTSOV, A. B; ZHERZDEV, A. V; FEOKTISTOV, N. A et al.International journal of electronics. 1995, Vol 78, Num 2, pp 289-295, issn 0020-7217Conference Paper

Temperature dependence of radiative and non-radiative lifetimes in hydrogenated amorphous siliconMUSCHIK, T; SCHWARZ, R.Journal of non-crystalline solids. 1993, Vol 164-66, pp 619-622, issn 0022-3093, 1Conference Paper

Compositional dependence of photoluminescence spectra in hydrogenated amorphous silicon-sulfur alloysMUSCHIK, T; SCHWARZ, R; HAMMAM, M et al.Journal of luminescence. 1991, Vol 48-49, pp 641-644, issn 0022-2313, 4 p., p.2Conference Paper

The relation between the visible and the infrared luminescence bands in porous silicon. Comparison with amorphous Si alloysPETROVA-KOCH, V; MUSCHIK, T.Thin solid films. 1995, Vol 255, Num 1-2, pp 246-249, issn 0040-6090Conference Paper

Electron spin resonance investigations of oxidized porous siliconMEYER, B. K; PETROVA-KOCH, V; MUSCHIK, T et al.Applied physics letters. 1993, Vol 63, Num 14, pp 1930-1932, issn 0003-6951Article

Characterization of interface properties in a-Si:H/a-Si_xC_1-x:H multilayers by the constant photocurrent methodWANG, F; FISCHER, T; MUSCHIK, T et al.Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties. 1993, Vol 68, Num 5, pp 737-751, issn 0958-6644Article

The luminescence of porous Si : the case for the surface state mechanismKOCH, F; PETROVE-KOCH, V; MUSCHIK, T et al.Journal of luminescence. 1993, Vol 57, Num 1-6, pp 271-281, issn 0022-2313Article

The wetting transition in high and low energy grain boundaries in the Cu(In) systemSTRAUMAL, B; MUSCHIK, T; GUST, W et al.Acta metallurgica et materialia. 1992, Vol 40, Num 5, pp 939-945, issn 0956-7151Article

Characterization of band tail states in amorphous silicon alloys by temperature dependent photoluminescenceMUSCHIK, T; SCHWARZ, R; KARG, F et al.Journal of luminescence. 1991, Vol 48-49, pp 636-640, issn 0022-2313, 5 p., p.2Conference Paper

A novel technique to study grain boundary and surface segregation under identical conditions with AES = Nouvelle technique d'étude de la ségrégation aux joints de grains et en surface sous des conditions identiques avec spectrométrie AugerMUSCHIK, T; HOFMANN, S; GUST, W et al.Scripta metallurgica. 1988, Vol 22, Num 3, pp 349-354, issn 0036-9748Article

Silver tracer diffusion in oriented Ag/Cu interphase boundaries and correlation to the boundary structureSOMMER, J; MUSCHIK, T; HERZIG, C et al.Acta materialia. 1996, Vol 44, Num 1, pp 327-334, issn 1359-6454Article

Temperature dependence and anisotropy of grain boundary self-diffusion along Σ=5 <001> tilt boundaries in AgSOMMER, J; HERZIG, C; MUSCHIK, T et al.Acta metallurgica et materialia. 1995, Vol 43, Num 3, pp 1099-1107, issn 0956-7151Article

The inclination dependence of the energy of Cu Σ3 and Σ19a grain boundariesSCHMELZLE, R; MUSCHIK, T; GUST, W et al.Scripta metallurgica et materialia. 1991, Vol 25, Num 8, pp 1981-1986Article

Surface and grain boundary segregation in Ni-In studied under identical conditions with AES = Ségrégation de surface et aux joints de grains dans Ni-In étudiée sous conditions identiques avec AESMUSCHIK, T; HOFMANN, S; GUST, W et al.Applied surface science. 1989, Vol 37, Num 4, pp 439-455, issn 0169-4332Article

Luminescence enhancement by electrochemical etching of SiC(6H)PETROVA-KOCH, V; SRESELI, O; POLISSKI, G et al.Thin solid films. 1995, Vol 255, Num 1-2, pp 107-110, issn 0040-6090Conference Paper

Limitations of interface sharpness in a-Si:H/a-SiC:H multilayersSCHWARZ, R; FISCHER, T; HANESCH, P et al.Applied surface science. 1991, Vol 50, Num 1-4, pp 456-461, issn 0169-4332, 6 p.Conference Paper

Energetic and kinetic aspects of the faceting transformation of a Σ3 grain boundary in CuMUSCHIK, T; LAUB, W; WOLF, U et al.Acta metallurgica et materialia. 1993, Vol 41, Num 7, pp 2163-2171, issn 0956-7151Article

Diffusion induced grain boundary migration of symmetric and asymmetric <011> {011} tilt boundaries during the diffusion of Zn into CuSCHMELZLE, R; GIAKUPIAN, B; MUSCHIK, T et al.Acta metallurgica et materialia. 1992, Vol 40, Num 5, pp 997-1007, issn 0956-7151Article

Rapid-thermal oxidized porous Si-The superior photoluminescent SiPETROVA-KOCH, V; MUSCHIK, T; KUX, A et al.Applied physics letters. 1992, Vol 61, Num 8, pp 943-945, issn 0003-6951Article

The influence of grain boundary inclination on the structure and energy of Σ=3 grain boundaries in copperWOLF, U; ERNST, F; MUSCHIK, T et al.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1992, Vol 66, Num 6, pp 991-1016, issn 0141-8610Article

Interfaces effectives et pentes d'Urbach de multicouches a-Si:H/a-SiN_x:HBEAUDOIN, M; MEUNIER, M; MUSCHIK, T et al.Canadian journal of physics (Print). 1992, Vol 70, Num 10-11, pp 824-829, issn 0008-4204Conference Paper

Correlation between optical properties and crystallite size in porous siliconLEHMANN, V; JOBST, B; MUSCHIK, T et al.Japanese journal of applied physics. 1993, Vol 32, Num 5A, pp 2095-2099, issn 0021-4922, 1Article

Thermodynamics of faceting Σ3 grain boundaries in CuMUSCHIK, T; LAUB, W; FINNIS, M. W et al.Zeitschrift für Metallkunde. 1993, Vol 84, Num 9, pp 596-604, issn 0044-3093Article

Theoretical prediction and direct observation of the 9R structure in AgERNST, F; FINNIS, M. W; HOFMANN, D et al.Physical review letters. 1992, Vol 69, Num 4, pp 620-623, issn 0031-9007Article